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Patricia Daukantas

Increasing the spatial resolution of X-ray microscopy.


Scatterings imageLeft: Conventional scanning electron micrograph image of the sample. Right: The super-resolution X-ray microscopy method visualizes details and line defects in the buried nanostructure.

A Swiss team’s new scanning and diffracting technique may one day dramatically increase the spatial resolution of X-ray microscopy. Pierre Thibault and colleagues at the Paul Scherrer Institut in Villigen, Switzerland, developed the method to bridge the gap between coherent diffractive imaging, which is a computationally intensive procedure, and scanning transmission X-ray microscopy, which limits resolution to the beam-spot size on the sample under study (Science 321, 379).

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