Feature
Microscopes for the Sub-Visible: Scanning the Near-Field in the Microwave to IR
Conventional microscopy is a mainstay of science and technology, yet it uses only the visible fraction of the spectrum, leaving the longer wavelength regime largely unexplored. With tiny antennas and scanning probe microscopes, however, researchers are beginning to shed new light onto this once-invisible world.
Log in or become a member to view the full text of this article.
This article may be available for purchase via the search at Optica Publishing Group.
Optica Members get the full text of Optics & Photonics News, plus a variety of other member benefits.