This book on characterizing nanostructured materials has the subtitle “Probing the Structure and Dynamics with Synchrotron X-Rays and Neutrons.” While ranging over a variety of topics dealing with the characterization of structure and internal dynamics of a wide variety of nanostructured materials, the treatment at times is too compressed to be genuinely informative for a general reader.
Instead, the primary audience for this text will be graduate students of physics and materials science, although anyone concerned with synchrotron X-ray and neutron methods for the characterization of nanomaterials in thin films and composite materials will profit from reading it. The book is very well-written and a pleasure to read.
Review by Christian Brosseau, Optica Fellow and professor of physics, Université de Bretagne Occidentale, Brest, France
The opinions expressed in the book review section are those of the reviewer and do not necessarily reflect those of OPN or its publisher, Optica (formerly OSA).