Feature Articles
Last month we reviewed the various subcommittees in the U.S. that are working on international optical standards and their leaders. Starting this month, we will take a more thorough look at the work of each subcommittee starting with SC1, Fundamental Standards.
by Robert E. Parks
![Manual probe system with needles for test of semiconductor on silicon wafer. [A. Morozov / Getty]](https://opnmedia.blob.core.windows.net/$web/opn/media/images/articles/2025/1125/departments/202511-cover-web.jpg?ext=.jpg)
![Researcher Clara Saraceno in the lab. [Image by Carsten Behler Photography]](https://opnmedia.blob.core.windows.net/$web/opn/media/images/articles/2025/1025/departments/202510-cover-web.jpg?ext=.jpg)
