I recommend this book for several reasons: it provides great insights into the principles and practical applications of classical and advanced interferometry in optical metrology, and it presents the main algorithms for recovering the modulating phase from single or multiple patterns. The depth and variety of this book will lead the serious reader to explore the background of optical metrology techniques, and he or she will find a comprehensive bibliography for this purpose. This book is clearly written and is aimed at graduate students and researchers in applied optics.
Review by Christian Brosseau, OSA Fellow and professor in the physics department at the Université de Bretagne Occidentale in Brest, France.
The opinions expressed in the book review section are those of the reviewer and do not necessarily reflect those of OPN or OSA.